A Zig-Zag Approach for Competitive Group Testing

DSpace/Manakin Repository

A Zig-Zag Approach for Competitive Group Testing

Show full item record

Title: A Zig-Zag Approach for Competitive Group Testing
Author(s):
Cheng, Yongxi;
Du, Dingzhu;
Xu, Yinfeng
Item Type: article
Keywords: Algorithms
Group testing
Fault-detection problems
Abstract: In many fault-detection problems, we want to identify defective items from a set of n items using the minimum number of tests. Group testing is a scenario in which each test is on a subset of items and determines whether the subset contains at least one defective item. In practice, the number d of defective items is often unknown in advance. In this paper, we present a new algorithm for the above group testing problem and prove that it has very good performance guarantee. More specifically, the number of tests used by the new algorithm is bounded from above by d log(n/d) + 3d + O(log² d). The new algorithm is designed based on a zig-zag approach that has not been studied before and is intuitive and easy to implement. When 0 < d < ρ₀ where ρ₀ = 1 − 4/e² = 0.45..., which holds for most practical applications, our new algorithm has better performance guarantee than any previous best result. Computational results show that the new algorithm has very good practical performances.
ISSN: 1091-9856
Persistent Link: http://dx.doi.org/10.1287/ijoc.2014.0591
http://hdl.handle.net/10735.1/4210
Terms of Use: ©2014 INFORMS
Sponsors: National Natural Science Foundation of China (Grants 11101326, 71071123), and the Program for Changjiang Scholars and Innovative Research Team in University (IRT1173).

Files in this item

Files Size Format View
JECS-FR-DDu-271319.60.pdf 395.6Kb PDF View/Open Article

This item appears in the following Collection(s)


Show full item record